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TDDB measurement probe
This is a dedicated prober for TDDB measurement. By using a dedicated ceramic card, it enables full contact measurement of 8-inch wafers, significantly contributing to the reduction of measurement time.
A significantly downsized and lower-priced ultra-low-cost prober compared to conventional probers.
This is a space-saving type of prober that has been downsized from the conventional size. It significantly improves throughput and utilizes optical technology for wafer alignment. Additionally, by efficiently accessing prober functions and testing functions through test applications, it greatly reduces the software development period.
